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DE-EMBEDDING USING A VECTOR NETWORK ANALYZER INCLUDING CALIBRATION AND MEASUREMENT TECHNIQUES

机译:使用包含校准和测量技术的矢量网络分析仪进行去嵌入

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摘要

The inclusion of adapters and test fixtures in a measurement setup is often necessary even if the consequence is less accuracy. De-embedding the device characteristics has been traditionally the most effective method of minimizing the negative effects. However, the process of de-embedding has been a laborious, expensive procedure restricted to a laboratory environment. De-embedding has recently been automated to uti-,. lize the technique in both the laboratory and production environments. This article reviews S-parameter and vector network analyzer (VNA) fundamental concepts and describes the process of modeling adapters and de-embedding their effects. A summary of the advantages of using de-embedding techniques in a production environment is presented.
机译:即使结果会降低精度,通常也需要在测量设置中包括适配器和测试夹具。传统上,去嵌入设备特性一直是最小化负面影响的最有效方法。但是,去嵌入的过程一直是费力,昂贵的过程,仅限于实验室环境。最近,去嵌入已自动进行。在实验室和生产环境中均采用该技术。本文回顾了S参数和矢量网络分析仪(VNA)的基本概念,并介绍了对适配器建模并对其效果进行去嵌入的过程。总结了在生产环境中使用去嵌入技术的优点。

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