Design of Solid-state, Wideband, High-power Microwave Amplifiers for Radiated Immunity Testing

摘要

This article illustrates how the requirements for amplifiers used in immunity testing are dictated by various EMC standards. A case is made for using solid-state devices rather than tubes. An overview of new transistor technologies is included, showing ranges of power and bandwidth typically obtainable from single devices. Key amplifier design issues, including load VSWR, thermal constraints and power combining techniques, are discussed. It is noted that a shift in amplifier design philosophy is necessitated by new device technologies, with nonlinear analysis and heat flow analysis emerging as essential design tools.