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首页> 外文期刊>Microwave and Wireless Components Letters, IEEE >Compact 35–70 GHz SPDT Switch With High Isolation for High Power Application
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Compact 35–70 GHz SPDT Switch With High Isolation for High Power Application

机译:具有高隔离度的紧凑型35–70 GHz SPDT开关,适合大功率应用

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摘要

This letter proposes a broadband high isolation and high power compact single pole double throw (SPDT) switch. In contrast to the traditional structure of grounded source pad, the source pad of the shunt-stacked FET is absorbed into the transmission line, and the drain of the shunt-stacked FET is grounded to a via-hole. This structure helps to extend the operation bandwidth and reduce the chip size. The proposed SPDT switch is composed of six shunt-stacked FET units on each branch with this novel structure. Stacked FETs technique increases the voltage handling by placing two FETs in series. It has been fabricated using a commercial 0.1~boldsymbol {mu }text{m} GaAs pseudomorphic high-electron-mobility transistor (PHEMT) process. The chip size is 1.2times 0.8 mm2. The switch operates at the frequency range of 35–70 GHz with less than 3 dB insertion loss and more than 40-dB isolation. The switch demonstrates a 1 dB insertion loss compression with a 20.2 dBm input power at 31 GHz. The isolation is larger than 30 dB from 10 to 95 GHz. To the best of the authors’ knowledge, this broadband isolation performance is among the best of the reported SPDT switches.
机译:这封信提出了一种宽带高隔离度和高功率紧凑型单刀双掷(SPDT)开关。与接地源极垫的传统结构相反,并联堆叠FET的源极垫被吸收到传输线中,并且并联堆叠FET的漏极接地到通孔。这种结构有助于扩展操作带宽并减小芯片尺寸。提出的SPDT开关由具有这种新颖结构的每个分支上的六个并联堆叠的FET单元组成。堆叠式FET技术通过将两个FET串联放置来提高电压处理能力。它是使用商业化的0.1粗体{mu} text {m} GaAs伪晶型高电子迁移率晶体管(PHEMT)工艺制造的。芯片尺寸为1.2×0.8mm2。开关工作在35–70 GHz的频率范围内,插入损耗小于3 dB,隔离度大于40 dB。该开关在31 GHz频率下具有10.2 dB的插入损耗压缩和20.2 dBm的输入功率。从10到95 GHz,隔离度大于30 dB。据作者所知,这种宽带隔离性能是所报告的SPDT交换机中最好的。

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