首页> 外文期刊>Microelectronics reliability >Towards Elastic Anisotropy And Strain-induced Void Formation In Cu-sn Crystalline Phases
【24h】

Towards Elastic Anisotropy And Strain-induced Void Formation In Cu-sn Crystalline Phases

机译:Cu-sn晶相中的弹性各向异性和应变诱导的空洞形成

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The Cu-Sn alloys have been used since ancient times. At present they attract much interest since the formation and growth of Cu-Sn intermetallic compounds, namely, Cu_3Sn and Cu_6Sn_5, play an important role in the kinetics of the soldering reaction in microelectronics packaging. Their formation kinetics as well as mechanical properties has shown to be crucial for the integrity of solder joints. In this work, we report elastic properties of Cu_3Sn and Cu_6Sn_5 crystalline phases using first-principles calculations based on the density functional theory. The elastic anisotropy of these phases, which is difficult to resolve from experiments, is fully discussed. Our results show that both crystalline phases have the greatest stiffness along the c direction. In particular, Cu_3Sn exhibits in-plane anisotropy, which is associated with the lattice modulation within the superstructure. We also propose a void formation mechanism based on the computed bond anisotropy of Sn-Cu and Cu-Cu in Cu_3Sn.
机译:Cu-Sn合金自古以来就被使用。目前,由于Cu-Sn金属间化合物Cu_3Sn和Cu_6Sn_5的形成和生长在微电子封装中的焊接反应动力学中起着重要作用,因此它们引起了人们的极大兴趣。它们的形成动力学以及机械性能对焊点的完整性至关重要。在这项工作中,我们使用基于密度泛函理论的第一原理计算报告了Cu_3Sn和Cu_6Sn_5晶相的弹性特性。充分讨论了这些相的弹性各向异性,这是很难从实验中解决的。我们的结果表明,两个晶相都沿c方向具有最大的刚度。特别地,Cu_3Sn表现出面内各向异性,其与上部结构内的晶格调制有关。我们还基于计算出的Cu_3Sn中Sn-Cu和Cu-Cu的键各向异性来提出空洞形成机理。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号