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Theoretical Estimation of Absoption Coefficients of Various Polymers at 13 nm

机译:各种聚合物在13 nm处的吸收系数的理论估计

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The linear absopiton coefficinents at 13 nm were calculated for more than 150 polymers. The results indicate that an aromatic substitution lowers the absorption coefficient. This is because oxygen hjas a larger atomic absoption than carbon or hydrogen and the substitution reduces the realtive oxygen content. Furthermore, hte Oh nishi parameters for the poymers were calculated in order to investigate the relationship bewtween the a bsorption at 13 nm and the etching resistance. This showed that polymers with aromatic groups toend to exhibit a woer absorptionn and a hgiher etching resistnace than those without aromatic groups. This suggests that, regrarding resist processes for EUV (extreme ultraviolet) lithography, a single-layeer resist process employing no hard-mask layer is another promising candidate in addition to one that uses both an unltrathin resist layer (  ̄100 nm thin) and a hard-mask ayer
机译:对于超过150种聚合物,计算了13 nm处的线性Absopiton系数。结果表明,芳族取代降低了吸收系数。这是因为氧比碳或氢具有更大的原子吸收性,并且取代降低了实际的氧含量。此外,为了研究聚合物在13 nm处的吸光度与耐蚀性之间的关系,计算了聚合物的nishi参数。这表明具有芳族基团的聚合物比没有芳族基团的聚合物表现出更差的吸收和更高的抗蚀刻性。这表明,重新使用EUV(极端紫外线)光刻的抗蚀剂工艺,不使用硬掩模层的单层抗蚀剂工艺是除了使用同时使用非ltrathin抗蚀剂层(薄至100 nm薄)和非utrathin抗蚀剂层的光刻胶工艺之外的另一种有希望的候选方法。硬面罩

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