...
首页> 外文期刊>Micro & nano letters >Formation of atomic point contacts and molecular junctions with a combined mechanical break junction and electrodeposition method
【24h】

Formation of atomic point contacts and molecular junctions with a combined mechanical break junction and electrodeposition method

机译:结合机械断裂结和电沉积方法形成原子点接触和分子结

获取原文
获取原文并翻译 | 示例

摘要

A method to create atomic point contacts and molecular junctions by combining mechanically controlled break junction and electrochemical deposition/etching techniques is described. This approach provides both stability and flexibility, and is suitable for studying electron transport properties of single molecule junctions or atomic point contacts in aqueous solutions and under potential control. Using the approach, the electron transport properties of 4,4''-bipyridine as a function of electrochemical gate and Ni point contacts have been studied
机译:描述了一种通过结合机械控制的断裂连接和电化学沉积/蚀刻技术来创建原子点接触和分子连接的方法。这种方法既提供稳定性又具有灵活性,并且适合于研究水溶液中并在电势控制下的单分子结或原子点接触的电子传输特性。使用该方法,研究了4,4''-联吡啶的电子传输性质与电化学栅极和Ni点接触的关系

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号