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System for Measuring the Spectral Distribution of Normal Emissivity of Metals with Direct Current Heating

机译:直流加热金属正态发射率光谱分布测量系统

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摘要

A system for measuring time variations of the normal spectral drissivity at wavelengths ranging from 0.55 to 5.3 μm was developed and applied to metal specimens in vacuum and oxidizing environments in the temperature range from 780 to 1200鉉. The specimen was heated to high temperatures by passing a direct current in a vacuum chamber, and the surface oxidation was controlled by a low-pressure oxidizing gas. The specimen temperature was measured by a single-band (0.9-μm) radiation thermometer viewing at a cavity formed in the specimen from the rear side. The front surface of the specimen was observed by a multiband (112-wavelength) radiation thermometer to measure the normal spectral emissivity. The effective normal spectral emissivity of the specimen cavity was evaluated to be 0.94t± 0.05 at a wavelength of 0.9 μm in comparison with a metal tube having a small blackbody hole on the rear. The measurement uncertainty of the normal spectral emissivitiy by the system was estimated to be 5 to 10 of the emissivity value in most of the interesting ranges of emissivities, temperatures, and wavelengths.
机译:开发了一种用于测量波长在0.55至5.3μm范围内的正常光谱微分率随时间变化的系统,并将其应用于温度范围为780至1200铉的真空和氧化环境中的金属样品。通过在真空室中通入直流电将样品加热至高温,并且通过低压氧化气体控制表面氧化。样品温度是通过单波段(0.9-μm)辐射温度计测量的,从背面观察样品中形成的空腔。用多波段(112波长)辐射温度计观察样品的前表面,以测量正常的光谱发射率。与在背面具有小黑体孔的金属管相比,在0.9μm的波长下,样品腔的有效法向光谱发射率评估为0.94t±0.05。在大多数有趣的发射率,温度和波长范围内,系统正常光谱发射率的测量不确定度估计为发射率值的5到10。

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