首页> 外文期刊>Metallurgical and Materials Transactions A >Grain Size, Misorientation, and Texture Evolution of Copper Processed by Equal Channel Angular Extrusion and the Validity of the Hall–Petch Relationship
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Grain Size, Misorientation, and Texture Evolution of Copper Processed by Equal Channel Angular Extrusion and the Validity of the Hall–Petch Relationship

机译:等通道角挤压处理的铜的晶粒尺寸,取向错误和纹理演变以及霍尔-提取关系的有效性

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The microstructure and texture of copper subjected to equal channel angular extrusion (ECAE) via route B C for up to 16 passes have been assessed using electron backscatter diffraction (EBSD), transmission electron microscopy (TEM), X-ray diffraction (XRD) peak broadening, and texture analysis. The differences in grain size measured by these techniques allows for an understanding of microstructural evolution. A gradual decrease in grain size occurs with an increasing number of passes, while the subgrain size remains approximately constant. Up to four passes, the fraction of high-angle grain boundaries (HAGBs) (>15 deg) increases from 15 to 45 pct, but remains constant thereafter. The grain boundary character distribution shows a decrease of Σ1 boundaries and an increase of Σ3 boundaries with higher passes. After 16 passes, a few regions of large 1 to 4 μm sized grains embedded in a submicrometer sized matrix were observed. These agglomerates of larger grain diameters together with the measured decrease in the dislocation density correlate with the observed decrease in yield strength of samples subjected to four and more passes. Texture evolution is adequately described under conditions of negative simple shear. The effect of increased accumulated strain results in an overall spread of orientation densities due to the absence of stable end positions post-ECAE. Detailed microstructural information suggests that strengthening mechanisms in the material can be sufficiently well described by the classical Hall–Petch relationship by applying it to the subgrain size, while the subgrain size remains smaller than the grain size.
机译:已通过电子反向散射衍射(EBSD),透射电子显微镜(TEM),X射线衍射()对经过BC 路径经过BC 等通道角挤压(ECAE)的铜的微观结构和织构进行了评估。 XRD)峰展宽和纹理分析。通过这些技术测得的晶粒尺寸差异允许对微观结构演变的理解。随着通过次数的增加,晶粒尺寸逐渐减小,而亚晶粒尺寸保持大致恒定。多达四道次,高角度晶界(HAGBs)(> 15度)的比例从15 pct增加到45 pct,但此后保持恒定。晶界特征分布表明,随着道次的增加,Σ1边界减小,而Σ3边界增大。经过16次通过后,观察到亚微米尺寸基质中嵌入了1至4μm尺寸大晶粒的一些区域。这些较大粒径的团聚体以及测得的位错密度的降低与经过四次或更多次通过的样品的屈服强度的降低相关。在负简单剪切的条件下充分描述了纹理演变。由于ECAE后缺乏稳定的末端位置,累积应变增加的结果导致取向密度的整体扩散。详细的微结构信息表明,通过将经典材料应用于亚晶粒尺寸,可以通过经典的Hall-Petch关系充分描述材料中的强化机制,而亚晶粒尺寸仍小于晶粒尺寸。

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