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Characterization of Fatigue Fracture in Ni-20 Pct Cr Alloys Using White Light Interference Microscopy and Scanning Probe Microscopy

机译:Ni-20 Pct Cr合金中疲劳断裂的白光干涉显微镜和扫描探针显微镜表征

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摘要

Nanostructured and ultra–fine-grained metals and alloys are becoming of engineering interest. However, little is known about the influence of grain refinement on fatigue crack behavior. In this study, fatigue crack growth behavior and the key microstructural features controlling the fatigue fracture in nanocrystalline and ultra–fine-grain nickel alloys, processed using different techniques, were investigated. White light interference microscopy as well as the combination of atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) were used to characterize the fractured surfaces of the metals. The role of grain size on the fatigue crack growth resistance and the effect of fracture surface roughness on the crack growth rate were evaluated. The combination of AFM and UFM is presented as a complementary tool to scanning electron microscopy in the fractography of metals.
机译:纳米结构和超细晶粒的金属和合金正在引起工程兴趣。但是,关于晶粒细化对疲劳裂纹行为的影响知之甚少。在这项研究中,研究了使用不同技术处理的纳米晶和超细晶粒镍合金的疲劳裂纹扩展行为和控制疲劳断裂的关键显微组织特征。白光干涉显微镜以及原子力显微镜(AFM)和超声力显微镜(UFM)的组合用于表征金属的断裂表面。评估了晶粒尺寸对疲劳裂纹扩展性的影响以及断裂表面粗糙度对裂纹扩展率的影响。 AFM和UFM的组合作为金属分形中扫描电子显微镜的补充工具。

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