首页> 外文期刊>Measurement techniques >DETECTING DIFFERENCES IN THE DEFORMATION PROPERTIES OF IDENTICAL OBJECTS BY MEANS OF A DIFFERENTIAL SPECKLE INTERFEROMETER
【24h】

DETECTING DIFFERENCES IN THE DEFORMATION PROPERTIES OF IDENTICAL OBJECTS BY MEANS OF A DIFFERENTIAL SPECKLE INTERFEROMETER

机译:用微分斑点干涉仪的方法检测同一物体的变形特性

获取原文
获取原文并翻译 | 示例
       

摘要

The circuit of a differential speckle interferometer that may be used to perform interference comparison of the deformations of identical objects is described. Results from experiments that illustrate the capabilities that may be achieved with the application of the device in quality control of materials and articles are presented.
机译:描述了可以用于对相同物体的变形进行干涉比较的差分散斑干涉仪的电路。给出了实验结果,这些结果说明了该设备在材料和物品的质量控制中的应用可能实现的功能。

著录项

  • 来源
    《Measurement techniques》 |2012年第3期|p.292-296|共5页
  • 作者

    S. D. Ivanova; A. E. Shtanko;

  • 作者单位

    Stankin State Technological University of Moscow, Moscow, Russia Translated from Izmeritel'naya Tekhnika, No. 3, pp. 37-40, March, 2012. Original article submitted December 1, 2011;

    Stankin State Technological University of Moscow, Moscow, Russia Translated from Izmeritel'naya Tekhnika, No. 3, pp. 37-40, March, 2012. Original article submitted December 1, 2011;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    speckle interferometer; digital image detection; flaw detection;

    机译:散斑干涉仪数字图像检测;探伤;
  • 入库时间 2022-08-17 13:11:09

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号