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Characterization and Modeling of a SiC MOSFET's Turn-Off Overvoltage

机译:SiC MOSFET关断过压的表征和建模

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摘要

The overvoltage during hard switching limits the full utilization of devices due to higher blocking voltage requirement. The faster switching speed of SiC MOSFET worsens the trade-off, and the understanding of the overvoltage’s mechanism is crucial for the better utilization. In this paper, experimental characterizations on the influence of circuit parasitic parameters and gate resistances on overvoltage are performed. Furthermore, a SPICE-based device behavioral model is built and found to able to accurately predict the overvoltage. The same method could be applied to device rating selection in converter design.
机译:由于较高的阻断电压要求,硬开关期间的过电压限制了设备的充分利用。 SiC MOSFET的较快开关速度使权衡恶化,并且对过压机制的理解对于更好地利用至关重要。在本文中,对电路寄生参数和栅极电阻对过电压的影响进行了实验表征。此外,建立并发现了基于SPICE的设备行为模型,可以准确预测过电压。相同的方法可以应用于转换器设计中的器件额定值选择。

著录项

  • 来源
    《Materials science forum》 |2018年第2018期|827-831|共5页
  • 作者单位

    Electrical Engineering and Computer Science University of Tennessee;

    Electrical Engineering and Computer Science University of Tennessee;

    Department of Electrical Engineering and Computer Science University of Tennessee;

    Department of Electrical Engineering and Computer Science University of Tennessee;

    Electrical Engineering and Computer Science University of Tennessee;

    Electrical Engineering and Computer Science University of Tennessee;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Hard Switching; Overvoltage; Silicon Carbide (SiC);

    机译:硬开关;过压;碳化硅(SiC);

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