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Theoretical analysis of the influence of defect parameters on photovoltaic performances of composition graded InGaN solar cells

机译:缺陷参数对成分梯度InGaN太阳能电池光伏性能影响的理论分析

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摘要

In this paper, we have used simulations to evaluate the impact of the distribution of electrically active defects on the photovoltaic performances of InGaN-based solar cell. The simulations were carried out using Silvaco's ATLAS software. We have modeled a P-GaN/Grad-InGaN/i-In_(0.53)Ga_(0.47)N/Grad-InGaN/N-ZnO where Grad-InGaN corresponds to an InGaN layer with a graded composition. This layer is inserted to eliminate the band discontinuities at the interface between InGaN and the GaN and ZnO layers. The defects were modeled through the introduction of band tails and a Gaussian distribution of defects in i-InGaN material. We have evaluated the influence of band tail widths as well as the parameters of the Gaussian distribution (i.e. defect density, mean position and standard deviation) on the short-circuit current, the open-circuit voltage and the fill-factor (efficiency) of the solar cell. These results have allowed us to identify key structural parameters useful for the optimization of InGaN solar cells, as well as to give realistic estimates of the performances of such cells.
机译:在本文中,我们已经使用模拟来评估电活性缺陷分布对InGaN基太阳能电池光伏性能的影响。使用Silvaco的ATLAS软件进行了仿真。我们对P-GaN / Grad-InGaN / i-In_(0.53)Ga_(0.47)N / Grad-InGaN / N-ZnO进行了建模,其中Grad-InGaN对应于具有渐变成分的InGaN层。插入该层是为了消除InGaN与GaN和ZnO层之间的界面处的能带不连续性。通过引入带尾和i-InGaN材料中缺陷的高斯分布来对缺陷进行建模。我们评估了带尾宽度以及高斯分布的参数(即缺陷密度,平均位置和标准偏差)对短路电流,开路电压和填充系数(效率)的影响。太阳能电池。这些结果使我们能够确定对优化InGaN太阳能电池有用的关键结构参数,并给出此类电池性能的实际估计。

著录项

  • 来源
    《Materials Science and Engineering》 |2013年第2期|142-148|共7页
  • 作者单位

    LGEP, UMR 8507, CNRS, SUPELEC, UPMC, Universite Paris-Sud 11,11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France;

    LGEP, UMR 8507, CNRS, SUPELEC, UPMC, Universite Paris-Sud 11,11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France;

    LGEP, UMR 8507, CNRS, SUPELEC, UPMC, Universite Paris-Sud 11,11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France,Department of Physics and Engineering Science, University of Versailles UVSQ, 45 Av. Des Etats Unis, 78035 Versailles, France;

    Georgia Institute of Technology, GT-Lorraine, 2 rue Marconi, 57070 Metz, France,UMI 2958 Georgia Tech, CNRS, 2 rue Marconi, 57 070 Metz, France;

    UMI 2958 Georgia Tech, CNRS, 2 rue Marconi, 57 070 Metz, France,LMOPS, UMR 7132, CNRS, University of Metz, Supelec, 2 rue E. Belin, 57 070 Metz, France;

    UMI 2958 Georgia Tech, CNRS, 2 rue Marconi, 57 070 Metz, France;

    UMI 2958 Georgia Tech, CNRS, 2 rue Marconi, 57 070 Metz, France;

    Georgia Institute of Technology, GT-Lorraine, 2 rue Marconi, 57070 Metz, France,UMI 2958 Georgia Tech, CNRS, 2 rue Marconi, 57 070 Metz, France;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    InGaN; solar cell; modeling; defect; graded bandgap;

    机译:氮化镓;太阳能电池;造型;缺陷;分级带隙;

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