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Deposition and characterisation of spray- deposited nanocrystalline Cd_(1-x)Zn_XS thin films for photovoltaic device applications

机译:用于光伏器件应用的喷雾沉积纳米Cd_(1-x)Zn_XS薄膜的沉积和表征

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摘要

Nanocrystalline Cd_(1-x)Zn_XS thin films (X = 0.2, 0.4, 0.6, 0.8) have been grown on glass substrate by spray pyrolysis technique using equimolar concentration aqueous solution of cadmium chloride, zinc acetate and thiourea. Prepared thin films have been characterised by UV-vis spectrophotometer, X-ray diffractometer, SEM/EDAX analysis and two-point probe set-up. The optical band gap of the films has been studied by transmission spectra in wavelength range 325-600 nm. It has been observed that optical band gap increases with increasing zinc concentration. The X-ray diffraction pattern of films indicated that the films are polycrystalline with hexagonal grain structure. The lattice parameters of prepared Cd_(1-x)Zn_XS films decrease with increase in zinc content. SEM/ EDAX analysis consolidates the formation of ternary compound. The DC electrical conductivity and activation energy of the films has been measured in vacuum by a two-point probe set-up. It has been observed that the electrical conductivity decreases with increasing Zn concentration in films.
机译:使用等摩尔浓度的氯化镉,醋酸锌和硫脲水溶液,通过喷雾热解技术在玻璃基板上生长了纳米晶Cd_(1-x)Zn_XS薄膜(X = 0.2、0.4、0.6、0.8)。制备的薄膜已通过紫外可见分光光度计,X射线衍射仪,SEM / EDAX分析和两点探针设置进行了表征。已经通过在325-600nm波长范围内的透射光谱研究了膜的光学带隙。已经观察到,光学带隙随着锌浓度的增加而增加。薄膜的X射线衍射图表明,薄膜是具有六方晶结构的多晶。制备的Cd_(1-x)Zn_XS薄膜的晶格参数随锌含量的增加而降低。 SEM / EDAX分析巩固了三元化合物的形成。薄膜的直流电导率和活化能已通过两点探针装置在真空中进行了测量。已经观察到,电导率随着膜中Zn浓度的增加而降低。

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