EPITAXIALLY GROWN LaNiO_3 THIN FILMS ON SrTiO_3(100) SUBSTRATES BY THE CHEMICAL SOLUTION METHOD

摘要

LaNiO_3 (LNO) thin films were spin-coated onto the SrTiO_3(l00) (STO) substrates by the chemical solution method. X-ray diffraction (XRD) 0-20 scans and X-ray B scans were used to determine the crystallinity and in-plane alignment behavior of the films. XRD patterns showed that the LNO thin films obtained by annealing at 600--750deg.C were highly oriented, while the film annealed at 800deg.C had random orientation. The resistivity vs. temperature curve of the epitaxially grown film annealed at 750deg.C, confirmed by B scanning, showed that the film possessed good metallic character. The fracture cross section of the epitaxial LNO film on STO was unifOrm and dense along the cross section direction.