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首页> 外文期刊>Materials Research Bulletin >Effects of rare earth ionic doping on microstructures and electrical properties of CaCu_3Ti_4O_(12) ceramics
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Effects of rare earth ionic doping on microstructures and electrical properties of CaCu_3Ti_4O_(12) ceramics

机译:稀土离子掺杂对CaCu_3Ti_4O_(12)陶瓷微观结构和电性能的影响

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摘要

Ca_(1-x)R_xCu_3Ti_4O_(12)(R = La, Nd, Eu, Gd, Er; x = 0 and 0.005) ceramics were prepared by the conventional solid-state method. The influences of rare earth (RE) ion doping on the microstructure, dielectric and electrical properties of CaCu_3Ti_4O_(12) (CCTO) ceramics were investigated systematically. Single-phase formation is confirmed by XRD analyses. The mean grain size decreases monotonically with reduced RE ion radius. The EDS results reveal that RE ionic doping reduces Cu-rich phase segregation at the grain boundaries (GBs). Doping gives rise to the monotonic decrease of dielectric constant with reduced RE ionic radius but significantly improves stability with frequency. The lower dielectric loss of doped samples is obtained due to the increase of GB resistance. In addition, the nonlinear coefficient and breakdown field increase with RE ionic doping. Both the fine grains and the enhancement of potential barrier at GBs are responsible for the improvement of the nonlinear current-voltage properties in doped CCTO samples.
机译:Ca_(1-x)R_xCu_3Ti_4O_(12)(R = La,Nd,Eu,Gd,Er; x = 0和0.005)陶瓷是通过常规固态方法制备的。系统地研究了稀土离子掺杂对CaCu_3Ti_4O_(12)(CCTO)陶瓷的微观结构,介电性能和电性能的影响。通过XRD分析证实了单相形成。随着RE离子半径的减小,平均晶粒尺寸单调减小。 EDS结果表明,RE离子掺杂减少了晶界(GBs)处富Cu相的偏析。掺杂会导致RE离子半径减小而介电常数单调下降,但会显着提高频率稳定性。由于GB电阻的增加,获得了较低的掺杂样品介电损耗。另外,非线性系数和击穿场随稀土离子掺杂而增加。细小晶粒和GBs处势垒的增强都有助于改善掺杂CCTO样品中的非线性电流-电压特性。

著录项

  • 来源
    《Materials Research Bulletin》 |2015年第6期|254-261|共8页
  • 作者单位

    School of Materials Science and Engineering, Xi'an University of Technology, Xi'an 710048, PR China,Department of Technology and Physics, Zhengzhou University of Light Industry, Zhengzhou 450002, PR China;

    Department of Technology and Physics, Zhengzhou University of Light Industry, Zhengzhou 450002, PR China;

    Department of Technology and Physics, Zhengzhou University of Light Industry, Zhengzhou 450002, PR China;

    Department of Technology and Physics, Zhengzhou University of Light Industry, Zhengzhou 450002, PR China;

    Department of Technology and Physics, Zhengzhou University of Light Industry, Zhengzhou 450002, PR China;

    School of Materials Science and Engineering, Xi'an University of Technology, Xi'an 710048, PR China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A. Ceramics; B. Microstructure; D. Dielectric properties; D. Electrical properties;

    机译:A.陶瓷;B.微观结构;D.介电性能;D.电性能;

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