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PIXE & XRD analysis of nanocrystals of Fe, Ni and Fe_2O_3

机译:Fe,Ni和Fe_2O_3纳米晶体的PIXE和XRD分析

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Nanocrystalline materials have become a subject of both scientific and industrial importance in the past decade. The present work deals with the preparation of α-Fe and Ni powders by high-energy ball mill method and chemically prepared α-Fe_2O_3 powders of nano crystalline type respectively. There is a need to characterize the trace elements in order to check the purity of these samples. The results of trace element analysis of these nanocrystals by using PIXE, characterization and size determination by XRD using Debye-Scherrer formula with full-width at half-maximum (FWHM) have been discussed.Nanocrystallinity is examined already by (TEM,FTIR and MICRO-RAMAN) experiments done previously.
机译:在过去的十年中,纳米晶体材料已经成为科学和工业上的重要课题。目前的工作涉及通过高能球磨法制备α-Fe和Ni粉末以及化学制备纳米晶型的α-Fe_2O_3粉末。需要表征痕量元素以检查这些样品的纯度。讨论了使用PIXE进行这些纳米晶体的痕量元素分析,使用Debye-Scherrer公式,半峰全宽(FWHM)进行XRD表征和尺寸确定的结果。已经通过(TEM,FTIR和MICRO)检验了纳米结晶度-RAMAN)之前完成的实验。

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