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Effect of thermal stress on magnetic domain patterns of multiferroic thin films

机译:热应力对多铁性薄膜磁畴图形的影响

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摘要

Effect of temperature on magnetic domain structure of Bi_(0.7)Dy_(0.3)FeO_3 (BDFO) multiferroic thin films is studied in situ using magnetic force microscopy (MFM). Initially, as the temperature increases the domains start aligning from irregular to more distinct stripe pattern. However, above 250℃, the domain alignment is disturbed. The systematic change in the domain configuration with temperature, suggests a strong thermal history of the system. The randomness in domain alignment caused above 250℃ is correlated to internal stress developed during ferromagnetic to paramagnetic phase transition occurring in BDFO. Indirect experimental evidence is given to support the explanation based on stress.
机译:利用磁力显微镜(MFM),研究了温度对Bi_(0.7)Dy_(0.3)FeO_3(BDFO)多铁性薄膜磁畴结构的影响。最初,随着温度的升高,畴开始从不规则条纹排列到更清晰的条纹图案。但是,在250℃以上,畴排列受到干扰。畴配置随温度的系统变化表明系统具有很强的热历史。 250℃以上引起的畴取向随机性与BDFO中发生的铁磁至顺磁相变过程中产生的内部应力有关。间接的实验证据被用来支持基于压力的解释。

著录项

  • 来源
    《Materials Letters》 |2010年第13期|1455-1457|共3页
  • 作者单位

    Centre for Excellence in Nanoelectronics, Department of Electrical Engineering, Indian Instituto of Technology Bombay, Mumbai 400076, India;

    rnCentre for Excellence in Nanoelectronics, Department of Electrical Engineering, Indian Instituto of Technology Bombay, Mumbai 400076, India;

    rnCentre for Excellence in Nanoelectronics, Department of Electrical Engineering, Indian Instituto of Technology Bombay, Mumbai 400076, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    atomic force microscopy; magnetic; thin film;

    机译:原子力显微镜磁性;薄膜;

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