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首页> 外文期刊>Materials Letters >Large enhancement of sub-band-gap light absorption of sulfur hyperdoped silicon by surface dome structures
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Large enhancement of sub-band-gap light absorption of sulfur hyperdoped silicon by surface dome structures

机译:表面穹顶结构大大增强了硫超掺杂硅的子带隙光吸收

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摘要

Sulfur hyperdoped silicon was usually prepared by sulfur ion implantation and nanosecond laser annealing. It has a smooth surface and a low sub-band-gap absorption of 30%. Here we report that the surface of silicon wafer was chemically textured before it was treated by the above two processes, which greatly enhanced the light absorption of the hyperdoped silicon from 30% to 70% in sub-band-gap wavelength and from 65% to 80% in visible wavelength for the antireflection characteristics of the formed dome structures. Consequently, the surface texture process will be a necessary step for device development that is based on sulfur hyperdoped silicon materials.
机译:硫超掺杂硅通常通过硫离子注入和纳秒激光退火制备。它具有光滑的表面和30%的低子带隙吸收率。在这里我们报告说,硅晶片的表面在经过上述两个过程处理之前已经化学纹理化,这大大提高了超掺杂硅在子带隙波长下的光吸收率从30%增至70%,从65%增至70%。可见光波长的80%用于形成的圆顶结构的抗反射特性。因此,表面纹理工艺将是基于硫超掺杂硅材料进行器件开发的必要步骤。

著录项

  • 来源
    《Materials Letters 》 |2013年第15期| 50-52| 共3页
  • 作者单位

    Institute for Computational Materials Science, School of Physics and Electronics, Henan University, Kaifeng 475004, PR China,Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, PR China;

    Institute for Computational Materials Science, School of Physics and Electronics, Henan University, Kaifeng 475004, PR China;

    Department of Technology and Physics, Zhengzhou University of Light Industry, Zhengzhou 450002, PR China;

    Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, PR China;

    Department of Physics, Fudan University, Shanghai 200433, PR China;

    Department of Physics, Fudan University, Shanghai 200433, PR China;

    Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, PR China;

    Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, PR China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Microstructure; Optical materials and properties; Hyperdoped silicon;

    机译:微观结构光学材料和性能;超掺杂硅;

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