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Fabrication of bifacial wafer-scale silicon nanowire arrays with ultra-high aspect ratio through controllable metal-assisted chemical etching

机译:通过可控的金属辅助化学刻蚀制备具有超高纵横比的双面晶圆级硅纳米线阵列

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摘要

Bifacial wafer-scale silicon nanowire arrays have been prepared through controllable deposition and metal-assisted chemical etching. Highly uniform silicon nanowire arrays with ultra-high aspect ratio have been obtained on both sides of the silicon wafer. The effects of Ag, HF, and H_2O_2 on the formation mechanism have been systematically investigated. The results indicated that the influence of H_2O_2 on the length of silicon nanowires, the surface density of arrays and the thickness of silicon wafer is more obvious than that of HF. Furthermore, the relationship between the length of silicon nanowires and the molar ratio of HF/H_2O_2 has been investigated. It demonstrated that the length of silicon nanowires is proportional to p when the concentration of HF in the etchant is constant, but in inversely proportion to p when the concentration of H_2O_2 is constant, where p is defined as [HF]/( [HF]+ [H_2O_2]). This strategy will be beneficial and revelatory for fabrication of bifacial solar cells based on this wafer-scale silicon nanowire arrays.
机译:通过可控沉积和金属辅助化学刻蚀已经制备了双面晶片级硅纳米线阵列。在硅晶片的两面都获得了具有超高纵横比的高度均匀的硅纳米线阵列。已经系统地研究了Ag,HF和H_2O_2对形成机理的影响。结果表明,H_2O_2对硅纳米线的长度,阵列的表面密度和硅片厚度的影响比HF更明显。此外,研究了硅纳米线的长度与HF / H_2O_2的摩尔比之间的关系。结果表明,当蚀刻剂中的HF浓度恒定时,硅纳米线的长度与p成正比,而当H_2O_2的浓度恒定时,硅纳米线的长度与p成反比,其中p定义为[HF] /([HF] + [H_2O_2])。该策略对于基于这种晶片级硅纳米线阵列的双面太阳能电池的制造将是有益的并且是具有启发性的。

著录项

  • 来源
    《Materials Letters》 |2015年第15期|437-442|共6页
  • 作者单位

    Institute for Interdisciplinary Research (IIR), Jianghan University, Wuhan 430056, China, Key Laboratory of Optoelectronic Chemical Materials and Devices of Ministry of Education, Jianghan University, Wuhan 430056, China;

    School of Physics and Technology, Wuhan University, Wuhan 430072, China;

    Key Laboratory of Optoelectronic Chemical Materials and Devices of Ministry of Education, Jianghan University, Wuhan 430056, China;

    Institute for Interdisciplinary Research (IIR), Jianghan University, Wuhan 430056, China, School of Physics and Technology, Wuhan University, Wuhan 430072, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Bifacial silicon nanowire arrays; Wafer-scale; Metal-assisted chemical etching; Microstructure; Semiconductors;

    机译:双面硅纳米线阵列;晶圆级;金属辅助化学蚀刻;微观结构半导体类;
  • 入库时间 2022-08-17 13:18:38

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