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Effect of ultraviolet and room lights on porous GaN films using photo-assisted electrochemical etching

机译:紫外线和室内光对多孔GaN薄膜使用光辅电化学蚀刻的影响

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We fabricated high reflectivity GaN/nanoporous (NP) GaN distributable Bragg reflector (DBR) structures by electrochemical etching of HF solution in ultraviolet (UV)- and room-light. Compared with in room-light, the DBR fabricated in UV-light has higher reflectivity. To elucidate the difference of these two DBRs, the effect of lights on the etching breakdown voltage, pore morphology, crystal quality and photoluminescence (PL) properties was studied in detail. By comparison, the NP-GaN film obtained under the UV-light has lower breakdown voltage, higher porosity, higher crystal quality and bigger red-shift of PL position, meaning that the DBR obtained in the UV-light has higher quality and reflectivity.
机译:我们通过在紫外(UV)中的HF溶液和室光中的HF溶液的电化学蚀刻制成高反射率GaN /纳米孔(NP)GaN分配布拉格反射器(DBR)结构。 与室内光相比,UV光制造的DBR具有更高的反射率。 为了阐明这两个DBR的差异,详细研究了灯光对蚀刻击穿电压,孔形态,晶体质量和光致发光(PL)性质的影响。 相比之下,在紫外线下获得的NP-GaN膜具有较低的击穿电压,孔隙率,更高的晶体质量和PL位置的更大的红移,这意味着在UV光中获得的DBR具有更高的质量和反射率。

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