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Pyrite FeS_2 films obtained by sulphuration of iron pre-deposited films

机译:通过铁预沉积膜的硫化获得黄铁矿FeS_2膜

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FeS_2 thin films crystallised in the cubic pyrite-type structure have been obtained by sulphuration of iron pre-deposited films. The iron films have been sulphurated at T_a = 823 K for t_a = 6 h. The lattice constant deduced from XRD measurements is a = 5.42 A. The binding energy values measured by XPS of the S 2p_(3/2) and Fe 2p_(3/2) are 162.3 and 707.12 eV, respectively. All these results are in good agreement with reference data. Scanning electron study shows that the grains are as thick as the films, however, the surface visualisation put in evidence that the crystallite sizes are roughly distributed in two distributions, the first with an average size of about 150 nm, the other one being about 500 nm. Such large distribution in the crystallite size justifies that the barrier height, which controls the conductivity of the films varies from one point to another one. Moreover, a high density of impurity states is present in the grains of the films. All this justifies the high carrier density and the small carrier mobility measured in the films.
机译:通过对铁预沉积膜进行硫化,获得了呈立方黄铁矿型结构结晶的FeS_2薄膜。铁膜已在T_a = 823 K的条件下被硫化了t_a = 6 h。从XRD测量得出的晶格常数为a = 5.42A。通过XPS测量的S 2p_(3/2)和Fe 2p_(3/2)的结合能值分别为162.3和707.12 eV。所有这些结果与参考数据都非常吻合。扫描电子研究表明,晶粒的厚度与薄膜的厚度相同,但是表面可视化显示微晶尺寸大致分布在两个分布中,第一个分布的平均尺寸约为150 nm,另一个分布的平均尺寸约为500 nm纳米微晶尺寸的如此大的分布证明控制膜的电导率的势垒高度在一个点到另一个点之间变化。此外,在膜的晶粒中存在高密度的杂​​质态。所有这些证明了在膜中测得的高载流子密度和小载流子迁移率。

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