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首页> 外文期刊>IEEE Transactions on Components, Packaging, and Manufacturing Technology. Part B, Advanced Packaging >Numerical stress analysis of resin cracking in LSI plastic packagesunder temperature cyclic loading. III. Material properties and packagegeometries
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Numerical stress analysis of resin cracking in LSI plastic packagesunder temperature cyclic loading. III. Material properties and packagegeometries

机译:温度循环载荷下LSI塑料封装中树脂开裂的数值应力分析。三,材料特性和包装几何形状

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摘要

In our previous reports [see ibid., vols. 19/20, p, 593/176, 1996/1997], geometries of the delaminations which are most likely to lead to resin cracking in large scale integration (LSI) packages subjected to temperature cyclic loading were identified for both Cu alloy and alloy 42 leadframe packages. In this paper, assuming these delaminations, we conduct comprehensive numerical stress analysis of resin cracking to study the effect of properties of encapsulant resin and die-bonding materials and the package geometry factors. The impacts of these design parameters on resin cracking are determined and a package design guide is established
机译:在我们以前的报告中[见同上,第一卷。 19/20,p,593/176,1996/1997],确定了铜合金和42合金在温度循环载荷下最可能导致大规模集成(LSI)封装中树脂破裂的分层几何形状。引线框封装。在本文中,假设存在这些分层,我们对树脂开裂进行全面的数值应力分析,以研究密封树脂和芯片接合材料的性能以及封装几何形状因素的影响。确定这些设计参数对树脂开裂的影响,并制定包装设计指南

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