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A Finite Element Analysis for Magnetostrictive Thin Film Structures and its Experimental Verification

机译:磁致伸缩薄膜结构的有限元分析及其实验验证

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摘要

In this paper, a finite element code especially for micro-magnetostrictive actuators was developed. Two significant characteristics of the presented finite element code are: (1) the magnetostrictive hysteresis phenomenon is effectively taken into account; (2) intrinsic geometric feature of typical thin film structures of large length to thickness ratio, which makes it very difficult to construct finite element mesh in the region of the thin film, is considered reasonably in modeling micro-magneostrictive actuators. For verification purpose, magnetostrictive thin films were fabricated and tested in the form of a cantilevered actuator. The Tb-Fe film and Sm-Fe film are sputtered on the Si and Polyimide substrates individually. The magnetic and magnetostrictive properties of the sputtered magnetostrictive films are measured. The measured magnetostrictive coefficients are compared with the numerically calculated ones.
机译:在本文中,开发了专门用于微磁致伸缩执行器的有限元代码。提出的有限元代码的两个重要特征是:(1)有效地考虑了磁致伸缩磁滞现象; (2)在微磁致伸缩执行器建模中,合理地考虑了典型的大长宽比薄膜结构的固有几何特征,这使得很难在薄膜区域内构造有限元网格。为了验证目的,以悬臂致动器的形式制造并测试了磁致伸缩薄膜。将Tb-Fe膜和Sm-Fe膜分别溅射在Si和聚酰亚胺衬底上。测量溅射的磁致伸缩膜的磁和磁致伸缩性能。将测得的磁致伸缩系数与数值计算的磁致伸缩系数进行比较。

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