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机译:具有良好数据保留能力的TaN / Cu_xO / Cu电阻存储器的保留失效机制
State Key Laboratory of ASIC and System Department of Microelectronics, Fudan University, Shanghai 200433, China;
State Key Laboratory of ASIC and System Department of Microelectronics, Fudan University, Shanghai 200433, China;
State Key Laboratory of ASIC and System Department of Microelectronics, Fudan University, Shanghai 200433, China;
State Key Laboratory of ASIC and System Department of Microelectronics, Fudan University, Shanghai 200433, China;
Memory Technology Development Center, Semiconductor Manufacturing International Corp., Shanghai 201203, China;
Memory Technology Development Center, Semiconductor Manufacturing International Corp., Shanghai 201203, China;
Memory Technology Development Center, Semiconductor Manufacturing International Corp., Shanghai 201203, China;
机译:氧化铜相含量及其对电脉冲感应的Cu_xO电阻随机存取存储器的电阻开关特性的影响
机译:通过表面改性提高Cu_xO电阻开关存储器的性能
机译:TaON接口在基于组合模型的Cu_xO电阻式开关存储器中的作用
机译:逻辑技术中的一种新型CU_XSI_YO电阻存储器,具有嵌入式应用的良好数据保留和电阻分布
机译:迈向数据可靠,低功耗和可修复的电阻式随机存取存储器。
机译:高保留退火的基于MgO的电阻开关存储器件的传导机制
机译:具有W和au反电极的Cu / siC电阻存储器的开关机制
机译:通过部分氧化降低Cu薄膜的电阻率:微观结构机制