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首页> 外文期刊>Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures >Fabrication of silicon nanopore arrays using a combination of dry and wet etching
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Fabrication of silicon nanopore arrays using a combination of dry and wet etching

机译:干法和湿法蚀刻相结合制造硅纳米孔阵列

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This paper presents a novel method for the fabrication of silicon nanopore arrays. The proposed method is based on inductive coupled plasma (ICP) etching and a two-step anisotropic wet etching, and can be used to fabricate individual nanopores, and massive nanopore arrays, with lower cost and less time compared with conventional fabrication processes. To optimize this nanopore fabrication process, the size of the ICP etch window was determined in a series of ICP experiments, and a theoretical analysis of the two-step wet etching was conducted. A nanopore array with an average feature size of 130 nm and a rectangular nanopore with a feature size of 38 nm were successfully obtained using this method. These results indicate the potential of this method for the large-scale production arrays of nanopores with desired sizes and shapes.
机译:本文提出了一种制造硅纳米孔阵列的新方法。所提出的方法基于电感耦合等离子体(ICP)刻蚀和两步各向异性湿法刻蚀,并且可用于制造单个纳米孔和大型纳米孔阵列,与传统的制造工艺相比,成本更低,时间更短。为了优化此纳米孔制造工艺,在一系列ICP实验中确定了ICP蚀刻窗口的大小,并对两步湿蚀刻进行了理论分析。使用该方法成功地获得了平均特征尺寸为130 nm的纳米孔阵列和特征尺寸为38 nm的矩形纳米孔。这些结果表明该方法对于大规模生产具有所需尺寸和形状的纳米孔阵列的潜力。

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