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How do normal faults grow?

机译:正常断层如何增长?

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Normal faults grow via synchronous increase in displacement and length ('propagating fault model', also known as the 'isolated fault model'), or by rapid length establishment and subsequent displacement accrual (constant-length fault model). We here use time-series displacement (D) and length (L) data from natural and experimental faults to elucidate growth styles and D-L trajectories throughout fault life, and to assess the applicability of the two fault models. We show that the growth of most faults is characterized by two stages, with the first defined by fault lengthening (20-30% of fault lifespan) and the second by displacement accrual (70-80% of fault lifespan). Although broadly adhering to the constant-length model, fault growth throughout the lengthening stage, during which significant displacement (10-60% of the total end-of-life fault displacement) may also accumulate, is achieved through rapid tip propagation, relay breaching, and segment linkage, characteristics perhaps most intuitively thought to reflect growth in accordance with the propagating model. The subsequent growth stage is dominated by displacement accrual with limited lateral tip propagation, a phenomenon best described by the constant-length model. We also show that, despite being used primarily in support of the propagating model, global displacement-length (D-L) datasets are equally compatible with the constant-length model.
机译:正常故障通过位移和长度的同步增加('传播故障模型',也称为“隔离故障模型”),或通过快速的长度建立和随后的位移应计(恒定长度故障模型)。我们在这里使用来自天然的时序位移(D)和长度(L)数据和实验性故障来阐明整个故障寿命的增长风格和D-L轨迹,并评估两个故障模型的适用性。我们表明,大多数故障的增长是以两个阶段为特征,第一次通过故障延长(20-30%的故障寿命)和第二个流离失所应计(70-80%的故障寿命)。虽然广泛地遵守恒定长度模型,但在整个延长阶段的故障生长,在此期间通过快速尖端传播实现显着的位移(总寿命最终断层置换的10-60%)也可以积累,继电器突破实现和分段连锁,特征可能是最直观地认为根据传播模型反映增长。随后的生长阶段由横向尖端传播有限的位移应计,是由恒定长度模型最佳描述的现象。我们还表明,尽管主要用于支持传播模型,但是全局位移长度(D-L)数据集与恒定长度模型同样兼容。

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