Determination of residual stress in a microtextured alpha titanium component using high-energy synchrotron X-rays

摘要

A shrink-fit sample is manufactured with a Ti-8Al-1Mo-1V alloy to introduce a multiaxial residual stress field in the disk of the sample. A set of strain and orientation pole figures are measured at various locations across the disk using synchrotron high-energy X-ray diffraction. Two approaches-the traditional sin(2) Psi method and the bi-scale optimization method-are taken to determine the stresses in the disk based on the measured strain and orientation pole figures, to explore the range of solutions that are possible for the stress field within the disk. While the stress components computed using the sin(2) Psi method and the bi-scale optimization method have similar trends, their magnitudes are significantly different. It is suspected that the local texture variation in the material is the cause of this discrepancy.