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Improved Lower Bounds for the Critical Probability of Oriented Bond Percolation in Two Dimensions

机译:二维方向定向键渗漏的临界概率的改进下界

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We present a coupled decreasing sequence of random walks on Z that dominate the edge process of oriented bond percolation in two dimensions. Using the concept of random walk in a strip, we describe an algorithm that generates an increasing sequence of lower bounds that converges to the critical probability of oriented percolation p c. From the 7th term on, these lower bounds improve upon 0.6298, the best rigorous lower bound at present, establishing 0.63328 as a rigorous lower bound for p c. Finally, a Monte Carlo simulation technique is presented; the use thereof establishes 0.64450 as a non-rigorous five-digit-precision (lower) estimate for p c.
机译:我们提出了Z上随机游走的耦合递减序列,该序列在二维中主导着定向键渗滤的边缘过程。使用带状区域中的随机游走的概念,我们描述了一种算法,该算法生成一个递增的下界序列,该序列收敛到定向渗滤的临界概率p c 。从第7项开始,这些下限将在当前最严格的下限0.6298的基础上提高,从而将0.63328设为p c的严格下限。最后,提出了一种蒙特卡洛仿真技术。其使用建立了0.64450作为p c的不精确的五位数精度(较低)估计。

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