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An Improved Analytical Model for Predicting the Switching Performance of SiC MOSFETs

机译:用于预测SiC MOSFET开关性能的改进分析模型

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摘要

This paper derives an improved analytical model to estimate switching loss and analyze the effects of parasitic elements on the switching performance of SiC MOSFETs. The proposed analytical model considers the parasitic inductances, the nonlinearity of the junction capacitances and the nonlinearity of the trans-conductance. The turn-on process and the turn-off process are illustrated in detail, and equivalent circuits are derived and solved for each switching transition. The proposed analytical model is more accurate and matches better with experimental results than other analytical models. Note that switching losses calculated based on experiments are imprecise, because the energy of the junction capacitances is not properly disposed Finally, the proposed analytical model is utilized to account for the effects of parasitic elements on the switching performance of a SiC MOSFET, and the circuit design rules for high frequency circuits are given.
机译:本文推导了一种改进的分析模型来估算开关损耗,并分析了寄生元件对SiC MOSFET开关性能的影响。所提出的分析模型考虑了寄生电感,结电容的非线性和跨导的非线性。详细说明了导通过程和关断过程,并为每个开关转换推导并求解了等效电路。所提出的分析模型比其他分析模型更准确,并且与实验结果更好地匹配。注意,根据实验计算出的开关损耗是不精确的,因为结电容的能量没有适当地放置。最后,利用所提出的分析模型来考虑寄生元素对SiC MOSFET开关性能的影响,以及电路给出了高频电路的设计规则。

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