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Prediction of the doubly charged ion pattern by modelling the high- and low-resolution mass spectra of isotopomeric forms

机译:通过对同分异构体形式的高分辨和低分辨质谱建模来预测双电荷离子图谱

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摘要

The presence of doubly charged ions in mass spectra is detected only occasionally because their clusters are observed more rarely than singly charged ones. The patterns connected with doubly charged ions are located in the spectrum below M/2. The narrow shapes of such patterns as well as overlapping with other bands generate significant problems in their interpretation. The method described here is based on modelling of the isotopomeric form of single- and double-charged mass ion clusters. The present work attempts to explain the generation of the double charge disotopomeric patterns of high- as well as low-resolution spectra. Predicting the high-resolution mass cluster is simpler than calculations of the low-resolution cluster. The high-resolution cluster may represent the initial form of low-resolution pattern formation.
机译:质谱中仅检测到双电荷离子的存在,因为与单电荷离子相比,很少观察到它们的簇。与双电荷离子连接的图形位于M / 2以下的光谱中。这种图案的狭窄形状以及与其他谱带的重叠在解释中产生了很大的问题。此处描述的方法基于单电荷和双电荷质量离子簇的同位素形式的建模。本工作试图解释高分辨和低分辨光谱的双电荷二聚体模式的产生。预测高分辨率质量簇比计算低分辨率簇更简单。高分辨率簇可以代表低分辨率图案形成的初始形式。

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