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机译:通过使用与设备相关的计量目标作为参考来提高覆盖精度的技术
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
United Microelectronics Corporation, Fab12 Engineering, No.18, Nan-Ke 2nd. Rd., Science-based Industrial Park, Hsin-Shi Tainan Country 744, Taiwan;
KLA-Tencor Israel, Optical Metrology Division Application, 1 Halavyan St. Migdal Ha'emek, 23100, Israel;
KLA-Tencor Corporation United States, Optical Metrology Division Application, One Technology Drive, Milpitas, California 95035, United States;
KLA-Tencor Israel, Optical Metrology Division Application, 1 Halavyan St. Migdal Ha'emek, 23100, Israel;
KLA-Tencor Corporation United States, Optical Metrology Division Application, One Technology Drive, Milpitas, California 95035, United States;
KLA-Tencor Taiwan, Optical Metrology Division Application, Tai Yuen Hi-Tech Industrial Park, No. 22 Taiyuan Street, Zhubei City ChuPei City, HsinChu Hsien Hsinchu County 302, Taiwan;
KLA-Tencor Taiwan, Optical Metrology Division Application, Tai Yuen Hi-Tech Industrial Park, No. 22 Taiyuan Street, Zhubei City ChuPei City, HsinChu Hsien Hsinchu County 302, Taiwan;
KLA-Tencor Israel, Optical Metrology Division Application, 1 Halavyan St. Migdal Ha'emek, 23100, Israel;
accuracy; device correlated metrology; overlay; Qmerit;
机译:设备相关的计量学,用于覆盖测量
机译:通过将计量基准从机床传递到工件来提高机床精度的技术
机译:基于球目标的外部校准技术,可使用现成的激光条纹传感器进行高精度3D计量
机译:通过使用DCM(设备相关计量)目标作为参考来提高叠加精度的创新技术
机译:基于物理和算法的技术可改善光刻的对准和覆盖。
机译:使用3D表面替代物通过门控深呼吸吸气式屏气技术提高左乳房辐射的碎裂目标位置精度
机译:通过使用器件相关的计量目标作为参考来提高覆盖精度的技术