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首页> 外文期刊>Journal of microanolithography, MEMS, and MOEMS >Device-level and module-level three-dimensional integrated circuits created using oblique processing
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Device-level and module-level three-dimensional integrated circuits created using oblique processing

机译:使用倾斜处理创建的设备级和模块级三维集成电路

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This paper demonstrates that another class of three-dimensional integrated circuits (3-D-ICs) exists, distinct from through-silicon-via-centric and monolithic 3-D-ICs. Furthermore, it is possible to create devices that are 3-D "at the device level" (i.e., with active channels oriented in each of the three coordinate axes), by performing standard CMOS fabrication operations at an angle with respect to the wafer surface into high aspect ratio silicon substrates using membrane projection lithography (MPL). MPL requires only minimal fixturing changes to standard CMOS equipment, and no change to current state-of-the-art lithography. Eliminating the constraint of two-dimensional planar device architecture enables a wide range of interconnect topologies which could help reduce interconnect resistance/capacitance, and potentially improve performance.
机译:本文证明存在另一类三维集成电路(3-D-IC),与以硅为中心的硅通孔和单片3-D-IC有所不同。此外,通过执行相对于晶圆表面成一定角度的标准CMOS制造操作,可以创建“处于设备级别”的3-D设备(即,具有沿三个坐标轴中的每个定向的有源通道)的设备。使用膜投射光刻(MPL)制成高纵横比的硅基板。 MPL只需要对标准CMOS设备进行最少的夹具更改,而无需更改当前的最新光刻技术。消除二维平面器件架构的限制,可以实现多种互连拓扑,这有助于降低互连电阻/电容,并有可能提高性能。

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