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Study of defect states in a-Se85Te15?x Pb x thin films by space charge limited conduction mechanism

机译:利用空间电荷限制传导机制研究a-Se85 Te15?x Pb x 薄膜中的缺陷态

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摘要

Current–Voltage (I–V) characteristics have been studied at various temperatures in vacuum evaporated thin films of a-Se85Te15?x Pb x (x = 0, 2, 4, 6) alloys. These characteristics show that, at low electric fields, an ohmic behaviour is observed. However, at high electric fields (E ~ 104 V/cm), the current becomes superohmic. At high fields, in case of samples having 0 and 2 at% of Pb, the experimental data fits well with the theory of space charge limited conduction (SCLC) in case of uniform distribution of localized states in the mobility gap. Such type of behaviour is not observed at higher concentration of Pb in the present glassy system due to high conductivity. In these samples, joule heating due to large currents may prohibit the measurement of SCLC. Using the theory of SCLC for the uniform distribution of the traps, the density of localized defect states near Fermi level is calculated for these compositions. The results indicate that the density of defect states near Fermi level increases on addition of Pb to binary Se85Te15alloy. This is explained in terms of electronegativity of Pb as compared to host elements.
机译:在不同温度下,对a-Se85 Te15?x Pb x 的真空蒸发薄膜研究了电流-电压(IV)特性(x = 0、2、4, 6)合金。这些特征表明,在低电场下,观察到欧姆行为。但是,在高电场(E〜104 V / cm)下,电流变为超欧姆。在高磁场下,如果样品的Pb含量为0和2 at%,则在迁移态间隙中局部态均匀分布的情况下,实验数据与空间电荷限制传导(SCLC)理论非常吻合。由于高电导率,在本玻璃态系统中,在较高的Pb浓度下未观察到此类行为。在这些样品中,由于大电流而产生的焦耳热可能会阻止SCLC的测量。使用SCLC理论对陷阱进行均匀分布,可以为这些成分计算出接近费米能级的局部缺陷状态的密度。结果表明,向二元Se85 Te15 合金中添加铅可提高费米能级附近的缺陷态密度。与主体元素相比,这是根据Pb的电负性来解释的。

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  • 来源
    《Journal of Materials Science》 |2007年第8期|2712-2716|共5页
  • 作者

    V. S. Kushwaha; A. Kumar;

  • 作者单位

    Department of Physics Harcourt Butler Technological Institute Kanpur 02 India;

    Department of Physics Harcourt Butler Technological Institute Kanpur 02 India;

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  • 正文语种 eng
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  • 入库时间 2022-08-18 02:22:38

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