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首页> 外文期刊>Journal of materials science >Room-temperature ultraviolet-ozone annealing of ZnO and ZnMgO nanorods to attain enhanced optical properties
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Room-temperature ultraviolet-ozone annealing of ZnO and ZnMgO nanorods to attain enhanced optical properties

机译:ZnO和ZnMGO纳米棒的室温紫外线退火以获得增强的光学性能

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摘要

ZnO and ZnMgO nanorods have proven to be promising materials for sensing, UV and deep UV based optoelectronic applications. A major drawback of ZnO and ZnMgO based thin films and nanorods is the presence of native point defects which deteriorates their optical efficiency and becomes an impediment to their efficient device applications. The furnace and rapid thermal annealing processes have overcome this up to a great extent but being high temperature processes, they put many fabrication and technological limits in device fabrication. Especially keeping an eye on the future flexible devices, herein we report ultraviolet-ozone (UVO) annealing as a room-temperature, simple and cost-effective annealing method to improve the optical efficiency of ZnO and ZnMgO nanorods along with control of defect states. The ZnO and ZnMgO nanorods were grown by hydrothermal method and annealed in UVO irradiation. UVO annealing substantially improved near band emission and suppressed defect band emissions. It is found that zinc interstitial atoms migrate from the top portion of ZnO nanorods towards the bottom of nanorods after UVO annealing, resulting in reduced zinc interstitial defects in the top portion of nanorods. X-ray diffraction results showed improvement in structural properties. XPS results confirmed suppression of oxygen vacancies and zinc interstitials and improvement in lattice oxygen in the ZnO nanorods after UVO annealing. Optimum times of UVO annealing for ZnO and ZnMgO nanorods were 30 and 50 min respectively. These findings will be helpful for the further development of ZnO and ZnMgO nanorods based high performance optoelectronic devices and sensors.
机译:ZnO和ZnMGO纳米棒已被证明是用于传感,UV和深紫色基于UV的光电应用的有希望的材料。基于ZnO和ZnMGO的薄膜和纳米棒的主要缺点是存在天然点缺陷,其降低了它们的光学效率,并成为其有效装置应用的障碍。炉子和快速的热退火工艺在很大程度上克服了这一点,而是克服了高温过程,它们在装置制造中进行了许多制造和技术限制。特别是对未来的柔性器件进行眼睛,在本文中,我们报告紫外线臭氧(UVO)退火为室温,简单且经济高效的退火方法,以提高ZnO和ZnMGO纳米棒的光学效率以及对缺陷状态的控制。通过水热法生长ZnO和ZnMGO纳米棒,并在UVO辐射中退火。 UVO退火基本上改善了近乐队排放和抑制缺陷带排放。发现锌间质原子从UVO退火后从ZnO纳米棒的顶部迁移到纳米棒的底部,导致纳米棒顶部的锌间质缺陷降低。 X射线衍射结果表明结构性质的改善。 XPS结果证实了UVO退火后ZnO纳米棒中氧气空位和锌间质性和锌间质性的抑制和改善。用于ZnO和ZnMGO纳米棒的UVO退火的最佳时间分别为30%和50分钟。这些发现将有助于进一步发展ZnO和ZnMGO纳米棒的高性能光电器件和传感器。

著录项

  • 来源
    《Journal of materials science》 |2020年第21期|18777-18790|共14页
  • 作者单位

    Department of Electrical Engineering Indian Institute of Technology Bombay Powai Mumbai Maharashtra 400 076 India;

    Centre for Research in Nanotechnology & Science Indian Institute of Technology Bombay Powai Mumbai Maharashtra 400 076 India;

    Department of Electrical Engineering Indian Institute of Technology Bombay Powai Mumbai Maharashtra 400 076 India;

    Department of Electrical Engineering Indian Institute of Technology Bombay Powai Mumbai Maharashtra 400 076 India;

    Department of Electronics and Communication Engineering Kalyani Government Engineering College Nadia West Bengal 741235 India;

    Department of Electronics and Communication Engineering Kalyani Government Engineering College Nadia West Bengal 741235 India;

    Department of Electrical Engineering Indian Institute of Technology Bombay Powai Mumbai Maharashtra 400 076 India;

    Department of Electronics and Communication Engineering National Institute of Technology Karnataka Suratkal Karnataka 575025 India;

    Department of Electrical Engineering Indian Institute of Technology Bombay Powai Mumbai Maharashtra 400 076 India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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