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首页> 外文期刊>Journal of materials science >Effect of solution concentration on surface morphology, chemical composition and photoresponse of CuO/Cu_2O composite thin films grown by hydrothermal synthesis
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Effect of solution concentration on surface morphology, chemical composition and photoresponse of CuO/Cu_2O composite thin films grown by hydrothermal synthesis

机译:溶液浓度对水热合成CuO / Cu_2O复合薄膜表面形貌,化学组成和光响应的影响

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摘要

Crystal structure, surface morphology, surface chemical composition and photocurrent response curves of the thin films were investigated by X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy and electrochemical workstation. The results show that the composite thin films are composed of CuO and CU_2O phase. The relative content of copper (Ⅰ) oxide on the composite thin films increases with the increase of solution concentration. Leaf-like CuO particles have been observed on the thin film grown in the 0.5 mol/L solution. Some regular octahedral and truncated octahedral Cu_2O particles have been observed on the surface of thin films grown in the 0.6 and 0.8 mol/L solution, respectively. The best photocurrent response and the fastest growth and decay have been observed in the thin film grown in 0.6 mol/L solution.
机译:通过X射线衍射,扫描电子显微镜,X射线光电子能谱和电化学工作站研究了薄膜的晶体结构,表面形态,表面化学组成和光电流响应曲线。结果表明,复合薄膜由CuO和CU_2O相组成。复合薄膜上氧化铜(Ⅰ)的相对含量随溶液浓度的增加而增加。在0.5 mol / L溶液中生长的薄膜上已观察到叶状CuO颗粒。在分别以0.6和0.8 mol / L溶液生长的薄膜表面上观察到一些规则的八面体和截断的八面体Cu_2O颗粒。在0.6 mol / L溶液中生长的薄膜中观察到最佳的光电流响应以及最快的生长和衰减。

著录项

  • 来源
    《Journal of materials science》 |2014年第11期|4877-4882|共6页
  • 作者单位

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China, National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China, School of Physics and Material Science, Anhui University, Hefei 230039, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230601, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    School of Physics and Material Science, Anhui University, Hefei 230039, China;

    School of Physics and Material Science, Anhui University, Hefei 230039, China;

    School of Physics and Material Science, Anhui University, Hefei 230039, China;

    School of Physics and Material Science, Anhui University, Hefei 230039, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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