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首页> 外文期刊>Journal of materials science >Effect of ethylene glycol monomethyl ether ratio in mixed solvent on surface morphology, wettability and photocatalytic properties of ZnO thin films
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Effect of ethylene glycol monomethyl ether ratio in mixed solvent on surface morphology, wettability and photocatalytic properties of ZnO thin films

机译:混合溶剂中乙二醇单甲醚比例对ZnO薄膜表面形貌,润湿性和光催化性能的影响

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摘要

Zinc oxide (ZnO) thin films with different ethylene glycol monomethyl ether (EGME) ratio were prepared on Si substrates using a two-step process. The results show that they possess a polycrystalline hexagonal wurtzite crystal structure. The topography of the ZnO thin films evolves from nanoparticles to hexagonal nanorods with the decrease of EGME content. The photolumines-cence spectra consist of a near-band-edge emission and two visible emissions. The optical band gap energy decreases first and then increases with the increase of EGME ratio in mixed solvent, the broadening of the optical band gap can be explained by Moss-Burstein effect. The wetting behavior of all the samples can switch from hydrophobicity to hydrophilicity through UV illumination. The degradation efficiency of the thin films increases with decreasing EGME content, photocatalytic reaction mechanism of the ZnO thin films is discussed in detail.
机译:采用两步法在硅衬底上制备了具有不同乙二醇单甲醚(EGME)比的氧化锌(ZnO)薄膜。结果表明它们具有多晶六方纤锌矿晶体结构。随着EGME含量的减少,ZnO薄膜的形貌从纳米颗粒演变为六角形纳米棒。光致发光光谱由近带边缘发射和两个可见发射组成。随着混合溶剂中EGME比的增加,光学带隙能量先减小,然后增加,光学带隙的变宽可以用莫斯-布尔斯坦效应来解释。通过紫外线照射,所有样品的润湿行为均可从疏水性变为亲水性。薄膜的降解效率随着EGME含量的降低而增加,详细讨论了ZnO薄膜的光催化反应机理。

著录项

  • 来源
    《Journal of materials science 》 |2014年第7期| 2948-2956| 共9页
  • 作者单位

    Institute of Solid State Physics, Chinese Academy of Sciences,Hefei 230031, China,School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China;

    School of Electronic and Information Engineering, Hefei Normal University, Hefei 230061, China,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,School of Physics and Material Science, Anhui University,Hefei 230039, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    School of Physics and Material Science, Anhui University,Hefei 230039, China;

    School of Physics and Material Science, Anhui University,Hefei 230039, China;

    School of Physics and Material Science, Anhui University,Hefei 230039, China;

    School of Physics and Material Science, Anhui University,Hefei 230039, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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