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首页> 外文期刊>Journal of materials science >Effect of Sb doping on the structural, electrical, and optical properties of SnO_2 thin films prepared through spray pyrolysis
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Effect of Sb doping on the structural, electrical, and optical properties of SnO_2 thin films prepared through spray pyrolysis

机译:Sb掺杂对喷雾热解制备SnO_2薄膜的结构,电学和光学性能的影响

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摘要

In this research, antimony-doped tin dioxide (ATO) films were deposited on glass substrates at T = 550 ℃ through spray pyrolysis. The effects of antimony doping on the structural, optical, and electrical properties of the thin films were investigated. Tin chloride (SnCl_4·5H_2O) and antimony chloride (SbCl_3) were used as a host and a dopant precursor, respectively. X-ray diffraction (XRD) analysis indicated that the undoped SnO_2 thin film exhibited a preferred (211) orientation. As the Sb doping concentration increased, a different preferred (200) orientation was observed. Field emission scanning electron microscopy analysis revealed polyhedron-like grains of the thin films. Atomic force microscopy analysis demonstrated that the minimum and maximum amounts of roughness were within the [Sb]/[Sn]% molar ratio of 10 and 7.5 at.% concentrations, respectively. As the doping concentration increased, the average grain size initially increased and then decreased; electrical resistance initially decreased and subsequently increased; the carrier concentration and Hall mobility initially increased and then decreased; and Seebeck coefficient decreased. The optical band gap of the thin films ranged from 3.16 to 3.8 eV. Hall effect and thermoelectric studies revealed that the films exhibited an n-type conductivity.
机译:在这项研究中,通过喷雾热解,在T = 550℃的玻璃基板上沉积了掺杂锑的二氧化锡(ATO)薄膜。研究了锑掺杂对薄膜的结构,光学和电学性质的影响。氯化锡(SnCl_4·5H_2O)和氯化锑(SbCl_3)分别用作主体和掺杂剂前体。 X射线衍射(XRD)分析表明,未掺杂的SnO_2薄膜表现出优选的(211)取向。随着Sb掺杂浓度的增加,观察到不同的优选(200)取向。场发射扫描电子显微镜分析显示出薄膜的多面体状晶粒。原子力显微镜分析表明,粗糙度的最小和最大量分别在10和7.5 at。%浓度的[Sb] / [Sn]%摩尔比内。随着掺杂浓度的增加,平均晶粒尺寸先增大然后减小。电阻最初降低,随后增加;载流子浓度和霍尔迁移率先升高后降低。和塞贝克系数下降。薄膜的光学带隙范围为3.16至3.8 eV。霍尔效应和热电研究表明,这些膜表现出n型导电性。

著录项

  • 来源
    《Journal of materials science》 |2016年第5期|4943-4950|共8页
  • 作者

    M. R. Fadavieslam;

  • 作者单位

    School of Physics, Damghan University, Damghan, Iran;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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