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首页> 外文期刊>Journal of materials science >Influences of Ag and In alloying on Sn-Bi eutectic solder and SnBi/Cu solder joints
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Influences of Ag and In alloying on Sn-Bi eutectic solder and SnBi/Cu solder joints

机译:Ag和In合金化对Sn-Bi共晶焊料和SnBi / Cu焊料接头的影响

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摘要

In this study, the Ag and In were alloyed to the Sn-58Bi solder, and their individual and combined influences on the SnBi solder and the SnBi/Cu solder joints were investigated. The results indicate that the In can effectively decrease the melting temperature and improve the wettability of the solder, while the Ag shows slight impacts on the melting behavior and the wetting properties. During the isothermal aging at 100 ℃, growth rate of the intermetallic compounds (LMCs) layer at the Ag-bearing solders/Cu interfaces are lower, while that at the In-bearing solders/Cu interfaces are much higher, because the substitution of Sn in the Cu_6Sn_5 IMC by In alters the interfacial diffusion behavior and assist in faster growth of IMCs layer. The Bi segregation at the long-term aged SnBi/Cu interface is eliminated in the aged SnBiAg/Cu, SnBiln/Cu and SnBiAgIn/ Cu solder joints. Tensile strength of all the solders joints decreases with increasing aging time, while the sharp decrease in the strength of the long-term aged SnBi/Cu solder joints is inhibited once the Bi segregation is eliminated, and fracture occurs mainly around the IMCs/solder interface. For the In-bearing solder joints, the Cu_6(Sn,In)_5 decrease the adhesion force between the solder and the interfacial IMCs, while the SnBiAg/Cu joints shows the highest strength. Based on the results, a more practicable method to inhibit the Bi embrittlement at the aged SnBi/Cu solder joints is proposed.
机译:在这项研究中,将Ag和In合金化到Sn-58Bi焊料中,并研究了它们对SnBi焊料和SnBi / Cu焊料接头的单独和综合影响。结果表明,In可以有效地降低熔化温度并改善焊料的润湿性,而Ag对熔化行为和润湿性能影响很小。在100℃的等温时效中,含银焊料/ Cu界面处的金属间化合物(LMCs)层的生长速率较低,而含In焊料/ Cu界面处的金属间化合物(LMCs)的生长速率较高,这是因为锡的替代In的Cu_6Sn_5 IMC中的I改变界面扩散行为并帮助IMC层更快地生长。长期老化的SnBiAg / Cu,SnBiln / Cu和SnBiAgIn / Cu焊点消除了长期老化的SnBi / Cu界面处的Bi偏析。随着老化时间的增加,所有焊点的抗拉强度降低,而一旦消除Bi偏析,则抑制了长期老化的SnBi / Cu焊点的强度急剧下降,并且断裂主要发生在IMC /焊点周围。对于含In的焊料接头,Cu_6(Sn,In)_5降低了焊料与界面IMC之间的附着力,而SnBiAg / Cu接头表现出最高的强度。根据结果​​,提出了一种更实用的方法来抑制老化的SnBi / Cu焊点处的Bi脆化。

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  • 来源
    《Journal of materials science 》 |2019年第20期| 18524-18538| 共15页
  • 作者单位

    Key Laboratory of Marine Materials and Related Technologies Zhejiang Key Laboratory of Marine Materials and Protective Technologies Ningbo Institute of Materials Technology and Engineering Chinese Academy of Sciences Ningbo 315201 China Nano Science and Technology Institute University of Science and Technology of China Suzhou 215123 China;

    Key Laboratory of Marine Materials and Related Technologies Zhejiang Key Laboratory of Marine Materials and Protective Technologies Ningbo Institute of Materials Technology and Engineering Chinese Academy of Sciences Ningbo 315201 China;

    Nano Science and Technology Institute University of Science and Technology of China Suzhou 215123 China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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