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首页> 外文期刊>Journal of materials science >Investigation of the temperature-dependent electrical properties of Au/PEDOT:WO_3/p-Si hybrid device
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Investigation of the temperature-dependent electrical properties of Au/PEDOT:WO_3/p-Si hybrid device

机译:Au / PEDOT:WO_3 / p-Si混合器件随温度变化的电学特性研究

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摘要

The electrical properties of Au/PEDOT:WO3/p-Si hybrid devices were studied in terms of current-voltage (I-V) and capacitance-voltage (C-V) measurements. Poly (3,4-ethylene dioxythiophene/tungsten trioxide (PEDOT:WO3) composite was prepared by an in situ chemical oxidative polymerization of monomer in 1-butyl-3-methylimidazoliumtetrafluoroborate (BMIMBF4). Optical and structural properties of the PEDOT:WO3 thin film was characterized by using FTIR, UV-Vis and AFM techniques. The bandgap energy of PEDOT:WO3 thin film was determined as 2.07 eV from UV-Vis spectrum. It was seen that the I-V plots of the Au/PEDOT:WO3/p-Si hybrid devices were non-linear and C-2-V plots were linear in the reverse bias defining rectification behavior. The values of barrier height obtained from the I-V and C-2-V plots of the fabricated devices were found to be 0.729 +/- 0.012 eV and 0.817 +/- 0.011 eV at room temperature in the dark environment, respectively. Devices have a high rectification behavior with a rectification ratio of 3.645 x 10(5) at +/- 1 V. The temperature-dependent I-V characteristics of one of the devices were also analyzed on the basis of the thermionic emission theory at low forward bias voltage regime. It was observed that the values of ideality factor decrease while the values of barrier height increase with increasing temperature. This kind of temperature dependence was attributed to the presence of the barrier inhomogeneity at the hybrid film/inorganic semiconductor interface. Then, by analysing of the forward bias I-V characteristics at double logarithmic scale, it was seen that the carrier transport in the Au/PEDOT:WO3/p-Si hybrid device demonstrates the space-charge-limited current (SCLC) conduction mechanism controlled by a trap distribution above the valence band edge dominates in the range 0.1-0.3 V voltages. Furthermore, by analyzing the reverse bias I-V-T characteristics, it was shown that Schottky emission was the dominating current conduction mechanism in the temperature range of 240-320 K.
机译:根据电流-电压(I-V)和电容-电压(C-V)测量研究了Au / PEDOT:WO3 / p-Si混合器件的电性能。通过在1-丁基-3-甲基咪唑鎓四氟硼酸酯(BMIMBF4)中进行单体的原位化学氧化聚合反应,制备了聚(3,4-乙烯二氧噻吩/三氧化钨)复合物PEDOT:WO3薄膜的光学和结构性质利用FTIR,UV-Vis和AFM技术对薄膜进行了表征,从紫外-可见光谱确定PEDOT:WO3薄膜的带隙能为2.07eV,可见Au / PEDOT:WO3 / p的IV图。 -Si混合器件是非线性的,C-2-V图在定义偏置行为的反向偏置中是线性的,从制造的器件的IV和C-2-V图获得的势垒高度值为0.729在黑暗环境中,室温下分别为+/- 0.012 eV和0.817 +/- 0.011 eV。器件具有较高的整流性能,在+/- 1 V时的整流比为3.645 x 10(5)。在此基础上,还分析了其中一种设备的IV特性。低正向偏压条件下的热电子发射理论。观察到,理想因子的值随着温度的升高而减小,而势垒高度的值则随着温度的升高而增加。这种温度依赖性归因于在杂化膜/无机半导体界面处的势垒不均匀性的存在。然后,通过在双对数尺度上分析正向偏压IV特性,可以看出Au / PEDOT:WO3 / p-Si混合器件中的载流子传输显示出受空间电荷限制电流(SCLC)传导的机制价带边缘以上的陷阱分布在0.1-0.3 V电压范围内占主导地位。此外,通过分析反向偏压I-V-T特性,可以证明肖特基发射是240-320 K温度范围内的主要电流传导机制。

著录项

  • 来源
    《Journal of materials science》 |2019年第17期|16676-16686|共11页
  • 作者单位

    Erciyes Univ Grad Sch Nat & Appl Sci Dept Phys TR-38039 Kayseri Turkey;

    Ahi Evran Univ Mucur Tech Vocat Sch Tech Prog Dept TR-40500 Kirsehir Turkey;

    Erciyes Univ Dept Phys Fac Sci TR-38039 Kayseri Turkey;

    Suleyman Demirel Univ Fac Arts & Sci Dept Chem TR-32260 Isparta Turkey;

    Bozok Univ Dept Comp Engn Fac Engn & Architecture TR-66000 Yozgat Turkey;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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