X-ray powder diffraction pattern of Bi_4(SiO_4)_+3

摘要

in cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi_4(SiO_4)_3 was redetermined with intensity figure-of-merits, which qualify agreement between observed and calculated relative intensities. F_30 is 158.90 (0.0059, 32), intensity figure of merit R_int is 8.7, I_20(17), 8.0. the values of figure-of-merits show that the data of JCPDS cards are distorted. Both the experimental and calculated peak positions and heights are listed in detail.