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首页> 外文期刊>Journal of Materials Research >Correlation of stress state and nanohardness via heat treatment of nickel-aluminide multilayer thin films
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Correlation of stress state and nanohardness via heat treatment of nickel-aluminide multilayer thin films

机译:镍铝多层薄膜热处理的应力状态与纳米硬度的相关性

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摘要

Heat treatment of gamma-Ni(Al)/gamma'-Ni_3Al multilayer thin films demonstrates that multilayer hardness correlates with the magnitude of biaxial stress in alternating layers. Films with a columnar grain morphology and (001) texture were fabricated over a range of volume fraction and bilayer thickness via direct current magnetron sputtering onto NaCl (001) substrates at 623 K. The films were removed from substrates, heat-treated at either 673 K or 1073 K in argon, and then mounted for nanoindentation and x-ray diffraction. The biaxial stress state in each phase was furnished from x-ray diffraction measurement of (002) interplanar spacings. The 673 K treatment increases the magnitude of alternating biaxial stress state by 70 to 100 percent and increases hardness by 25 to 100 percent, depending on bilayer thickness. In contrast, the 1073 K heat treatment decreases the stress magnitude by 70 percent and decreases hardness by 50 percent. The results suggest that the yield strength of these thin films is controlled, in part, by the magnitude of internal stress. Further, thermal treatments are demonstrated to be an effective means to manipulate internal stress.
机译:γ-Ni(Al)/γ'-Ni_3Al多层薄膜的热处理表明,多层硬度与交替层中双轴应力的大小相关。通过在623 K的NaCl(001)衬底上进行直流磁控溅射,在一定的体积分数和双层厚度范围内制造出具有柱状晶粒形态和(001)织构的薄膜。将薄膜从衬底上移除,在673处进行热处理K或1073 K在氩气中,然后安装用于纳米压痕和X射线衍射。由(002)晶面间距的X射线衍射测量提供每个相中的双轴应力状态。 673 K处理取决于双层厚度,使双向双轴应力状态的变化幅度增加了70%至100%,硬度增加了25%至100%。相反,1073 K热处理将应力大小降低了70%,硬度降低了50%。结果表明,这些薄膜的屈服强度部分受内部应力的大小控制。此外,热处理被证明是控制内部应力的有效手段。

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