In situ observation of phase formation in a Cu-In-2Se precursor layer using micro-Raman scattering spectroscopy

摘要

In situ observation of phase formations in Cu-In-2Se (atomic ratio) precursor layers was carried out using temperature-dependent micro-Raman scattering spectroscopy. Without the protection of a high Se vapor pressure, intermediate In-Se and Cu-Se selenides and CuAu-ordered CuInSe_2 were easily formed in the amorphous precursor layer, which have atomic structures arranged in a way close to that of α-CIS. The binary selenides were transformed to the α-CIS by in-/out-diffusion of the mobile Cu and Se atoms/ions. The γ-CuSe and α-CIS began to form at a temperature as low as ～170 ℃.