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首页> 外文期刊>Journal of Materials Research >Piezoelectric, Ferroelectric Pb(mg_(1/3)nb_(2/3))o_3-pbtio_3 Thin Films With Compositions Around The Morphotropic Phase Boundary Prepared By A Sol-gel Process Of Reduced Thermal Budget
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Piezoelectric, Ferroelectric Pb(mg_(1/3)nb_(2/3))o_3-pbtio_3 Thin Films With Compositions Around The Morphotropic Phase Boundary Prepared By A Sol-gel Process Of Reduced Thermal Budget

机译:通过减少热收支的溶胶-凝胶法制备的压电相,铁电相Pb(mg_(1/3)nb_(2/3))o_3-pbtio_3薄膜,具有在变质相边界周围的组成

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摘要

Single perovskite polycrystalline Pb(Mg_(1/3)Nb_(2/3))O_3-PbTiO_3 (PMN-PT) thin films with PMN to PT ratios around the morphotropic phase boundary composition (070PMN-0.30PT, 0.65PMN-0.35PT, and 0.60PMN-0.40PT) have been prepared by chemical solution deposition (CSD). Air-stable and precipitate-free PMN and PT precursor sols were separately synthesized, and PMN-PT sols were obtained by the simple mixture in air of the former. The PMN-PT sols were deposited onto Pt-coated Si substrates and dried on a hot-plate. Crystallization of the films was carried out by rapid thermal processing (RTP) in oxygen, using different temperatures, soaking times, and heating rates. Single perovskite PMN-PT thin films were obtained at low temperatures (650 ℃) with short soaking times (6s) and rapid heating rates (200 ℃/s). The films show a columnar growth and a uniform thickness. Both the evolution of the perovskite distortion and the electrical properties with the PMN to PT ratio indicate the correct formation of the solid solution. The temperature and frequency dependences of the permittivity and the ferroelectric loops also indicate an increase of the relaxor characteristic of the films as compared with bulk materials. Piezoelectric coefficients were measured across the ferroelectric loop by optical interferometry, and an enhancement of piezoelectricity at the MPB composition was found. A piezoelectric d_(33) coefficient of ~55 pC/N was measured in ~300-nm-thick films of this composition with a saturation polarisation of P_s ~25 μC/cm~2.
机译:单晶钙钛矿多晶Pb(Mg_(1/3)Nb_(2/3))O_3-PbTiO_3(PMN-PT)薄膜,其变质相边界成分周围的PMN与PT之比(070PMN-0.30PT,0.65PMN-0.35PT ,以及0.60PMN-0.40PT)已通过化学溶液沉积(CSD)制备。分别合成了空气稳定和无沉淀的PMN和PT前体溶胶,通过在前者的空气中简单混合即可获得PMN-PT溶胶。将PMN-PT溶胶沉积到涂有Pt的Si基板上,并在热板上干燥。膜的结晶是通过在氧气中使用不同的温度,浸泡时间和加热速率通过快速热处理(RTP)进行的。低温(650℃),均热时间(6s)短,加热速率快(200℃/ s)获得了钙钛矿型PMN-PT薄膜。膜显示出柱状生长和均匀的厚度。钙钛矿畸变的发展以及具有PMN与PT之比的电性能均表明固溶体的正确形成。与块状材料相比,介电常数和铁电回路的温度和频率依赖性还表明膜的弛豫特性增加。通过光学干涉法测量整个铁电回路的压电系数,发现MPB成分的压电性增强。在这种成分的〜300 nm厚膜中,测得的压电d_(33)系数为〜55 pC / N,饱和极化率为P_s〜25μC/ cm〜2。

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