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首页> 外文期刊>Journal of Materials Research >Reactive magnetron sputtering of transparent conductive oxide thin films: Role of energetic particle (ion) bombardment
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Reactive magnetron sputtering of transparent conductive oxide thin films: Role of energetic particle (ion) bombardment

机译:透明导电氧化物薄膜的反应磁控溅射:高能粒子(离子)轰击的作用

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摘要

Transparent conductive oxides (TCOs) are degenerately doped compound semiconductors with wide band gaps (E-g > 3 eV), which are used as transparent electrodes in optoelectronic devices. Reports on the influence of negative ions on the electrical properties of TCO films are reviewed and compared with our results. It was reported that the radial resistivity distributions depend (i) on the excitation mode of the magnetron (direct current or radio frequency), (ii) on the erosion state of the sputtering target, and (iii) on the density of the ceramic targets. This can be explained by the fact that the negative ions in magnetron discharges (in our case O~-) are generated at the target surface and accelerated toward the growing films. Their energy and their radial distribution depend on the discharge voltage and the shape of the emitting surface, i.e., of the erosion groove. Ways for reducing the effect of negative ion bombardment are discussed.
机译:透明导电氧化物(TCO)是具有宽带隙(E-g> 3 eV)的简并掺杂化合物半导体,在光电器件中用作透明电极。审查了有关负离子对TCO薄膜电性能的影响的报告,并将其与我们的结果进行了比较。据报道,径向电阻率分布取决于(i)磁控管的激励模式(直流或射频),(ii)溅射靶的腐蚀状态以及(iii)陶瓷靶的密度。这可以通过以下事实来解释:磁控管放电中的负离子(在我们的情况下为O〜-)在目标表面生成并朝着正在生长的膜加速。它们的能量及其径向分布取决于放电电压和发射表面的形状,即腐蚀槽的形状。讨论了减少负离子轰击效果的方法。

著录项

  • 来源
    《Journal of Materials Research》 |2012年第5期|p.765-779|共15页
  • 作者

    Klaus Ellmer; Thomas Welzel;

  • 作者单位

    Helmholtz-Zentrum fur Materialien und Energie GmbH, 14109 Berlin, Germany;

    Helmholtz-Zentrum fur Materialien und Energie GmbH, 14109 Berlin, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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