首页> 外文期刊>Journal of Lightwave Technology >Parameter Space Exploration in Dispersion Engineering of Multilayer Silicon Waveguides from Near-Infrared to Mid-Infrared
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Parameter Space Exploration in Dispersion Engineering of Multilayer Silicon Waveguides from Near-Infrared to Mid-Infrared

机译:从近红外到中红外的多层硅波导色散工程中的参数空间探索

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摘要

Dispersion engineering is important in integrated photonics with a high index contrast. We present an exploration of the parameter space in dispersion-engineered silicon multilayer waveguides, based on a strip/slot hybrid waveguide structure. The relationship between low-dispersion bandwidth and dispersion variation is extensively investigated under different index contrasts between silicon and slot material and various structural parameter sets. Our results show that with a refractive index ranging from 1.4 to 2.9, any real material can be used in combination with silicon for dispersion flattening in principle, as long as device fabrication technologies allow. This paper provides a general guideline for future designs of dispersion-flattened silicon waveguides. Ultrawide low dispersion with a dispersion variation of around ±35 ps/(nm·km) can be obtained over a 2000-nm wavelength range, from the near-infrared to the mid-infrared.
机译:色散工程在具有高折射率对比度的集成光子学中很重要。我们基于条带/缝隙混合波导结构,对色散工程硅多层波导中的参数空间进行了探索。在硅和缝隙材料之间的不同折射率对比以及各种结构参数集的情况下,广泛研究了低色散带宽与色散变化之间的关系。我们的结果表明,只要器件制造技术允许,原则上任何真实的材料都可以与硅结合使用以使色散平坦化,并且折射率范围为1.4至2.9。本文为色散平坦的硅波导的未来设计提供了一般指导。在从近红外到中红外的2000 nm波长范围内,可以获得大约±35 ps /(nm·km)的色散变化的超宽低色散。

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