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Laser Scribing of Sapphire Substrate to Increase Side Light Extraction of GaN-Based Light Emitting Diodes

机译:蓝宝石衬底的激光划刻可增加GaN基发光二极管的侧光提取

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摘要

Generally, the laser scribing was done after GaN-based light emitting diodes (LEDs) growth. This study verified that the utilization of laser scribing leads to an increase in the surface roughness of sapphire substrate sidewalls, which reduces the probability of total internal reflection from light striking the sapphire/air interface. Laser scribing also helps increase side light extraction intensity and output power of GaN-based light emitting diodes. Study results indicated that lasers create a laser scribing layer (LSL) at a depth of approximately 30 $mu$ m after GaN-based LEDs grown in the sapphire substrate undergo laser scribing. Scanning electron microscopy was used to observe the rough surface of the LSL, while near-field optical images verified that rough surface LSL contributes to an increase in side wall light extraction intensity of LEDs. Furthermore, changing the depth of focus of the laser beam (from 0 $mu$m to 36 $mu$m) allows the formation of a large quantity of 3 to 5 $mu$m holes on the LSL. Measurement results indicated that these holes caused the LSL surface to be even rougher, which further strengthened LED side wall light extraction intensity. The results after packaging show that LSL with holes increase output power at 20 mA of GaN-based LEDs by approximately 12.2 %.
机译:通常,在基于GaN的发光二极管(LED)生长之后进行激光刻划。这项研究证实了激光划刻的使用会导致蓝宝石衬底侧壁的表面粗糙度增加,从而降低了入射到蓝宝石/空气界面的光产生的全内反射的可能性。激光划刻还有助于提高GaN基发光二极管的侧光提取强度和输出功率。研究结果表明,在蓝宝石衬底中生长的GaN基LED经过激光刻划之后,激光器会在大约30μm的深度处创建激光刻划层(LSL)。扫描电子显微镜用于观察LSL的粗糙表面,而近场光学图像证实粗糙表面LSL有助于增加LED的侧壁光提取强度。此外,改变激光束的聚焦深度(从0μm至36μm)允许在LSL上形成大量的3至5μm的孔。测量结果表明,这些孔使LSL表面更加粗糙,从而进一步增强了LED侧壁的光提取强度。封装后的结果表明,带孔的LSL在20 mA的GaN基LED上增加了约12.2%的输出功率。

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