机译:使用X射线微计算机断层扫描(μCT)对传统烤箱和强制对流连续滚转(FCCT)焙烤对全麦仁的三维微观结构的影响进行无损表征和量化
Univ Stellenbosch, Dept Food Sci, Private Bag X1, ZA-7602 Stellenbosch, South Africa;
Univ Stellenbosch, Cent Analyt Facil, CT Scanner, Private Bag X1, ZA-7602 Stellenbosch, South Africa;
Univ Stellenbosch, Dept Food Sci, Private Bag X1, ZA-7602 Stellenbosch, South Africa;
Microstructure; X-ray micro-computed tomography; Image analysis; Roasting; Porosity;
机译:烤箱和强制对流连续翻滚(FCCT)焙烧:对小麦籽粒的物理化学,结构和功能性质的影响
机译:烤箱和强制对流连续翻滚(FCCT)焙烧对白玉米微观结构和干磨性的影响
机译:X射线微计算机断层扫描(μCT)用于食品微结构的无损表征
机译:X射线微型计算机断层扫描通过连续双螺杆造粒机制备的颗粒微观结构分析