Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs

摘要

Analog and mixed-signal testing is becoming an important issue that affects both the time-to-market and the product cost of many SoCs. In order to provide an efficient testing method for 865–870 MHz low noise amplifiers (LNAs), which constitute a mixed-signal circuit, a novel BIST method is developed. This BIST can be easily implemented with a RF peak detector and two comparators. The circuit used in the test and the LNA are designed using 0.35 µm CMOS technology. The simulation results show higher fault coverage than that of previous test methods. A total of twenty eight short and open (catastrophic) faults and eleven variation parameters have been introduced into the LNA, giving fault coverage of 100% for catastrophic faults and parametric variation. Thus, it provides an efficient structural test, which is suitable for a production test in terms of an area overhead, a test accessibility, and test time.