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Mechanical Testing for Stretchable Electronics

机译:可拉伸电子器件的机械测试

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摘要

Stretchable electronics have been a subject of increased research over the past decade (Lacour, S., et al., 2006, "Mechanisms of Reversible Stretchability of Thin Metal Films on Elastomeric Substrates," Appl. Phys. Lett., 88(20), p. 204103; Lacour, S., et al., 2004, "Design and Performance of Thin Metal Film Interconnects for Skin-Like Electronic Circuits," IEEE Electron Device Lett., 25(4), pp. 179-181; and Maghribi, M., et al., 2005, "Stretchable Micro-Electrode Array," International IEEE-EMBS Conference on Microtechnologies in Medicine and Biology, pp. 80-83.). Although stretchable electronic devices are a relatively new area for the semiconductor/electronics industries, recent market research indicates that the market could be worth more than $900 million by 2023 (PR Newswire, 2015, "Stretchable Electronics Market Worth $911.37 Million by 2023," PR Newswire, Albuquerque, NM.). This paper investigates mechanical testing methods designed to test the stretching capabilities of potential products across the electronics industry to help quantify and understand the mechanical integrity, response, and the reliability of these devices. Typically, the devices consist of stiff modules connected by stretchable traces (Loher, T., et al., 2006, "Stretchable Electronic Systems," Electronics Packaging Technology Conference (EPTC '06), pp. 271-276.). They require electrical and mechanical connectivity between the modules to function. In some cases, these devices will be subject to biaxial and/or cyclic mechanical strain, especially for wearable applications. The ability to replicate these mechanical strains and understand their effect on the function of the devices is critical to meet performance, process, and reliability requirements. In this paper, methods for simulating biaxial and out-of-plane strains similar to what may occur in a wearable device on the human body are proposed. Electrical and/or optical monitoring (among other methods) can be used to determine cycles to failure depending on expected failure modes. Failure modes can include trace damage in stretchable regions, trace damage in functional component regions, or bulk stretchable material damage, among others. Three different methods of applying mechanical strain are described, including a stretchable air bladder method, membrane test method, and lateral expansion method.
机译:伸展电子器件是过去十年的研究提高的主题(Lacour,S.等,2006,2006,“薄金属膜对弹性体基材上的可逆拉伸性的机制,”苹果。物理。Lett。,88(20) ,p。204103; Lacour,S.等,2004年,“薄金属薄膜的设计和性能,用于皮肤状电子电路,”IEEE电子设备Lett。,25(4),PP。179-181;和Maghribi,M.等,2005年,“可拉伸微电极阵列”,国际IEEE-embs在医学和生物学中微型技术会议,PP。80-83。)。虽然可伸缩的电子设备是半导体/电子行业的相对较新的区域,但最近的市场研究表明,在2023年(PR Newswire,2015年,市场上的市场可能值得超过9亿美元,以91137百万美元,“公关”新闻中心,阿尔伯克基,纳米。)。本文调查了机械测试方法,旨在测试各种电子行业潜在产品的拉伸能力,以帮助量化和理解这些器件的机械完整性,响应和可靠性。通常,该器件由可拉伸迹线(宽宽,T.等,2006,“拉伸电子系统”连接的硬质模块组成,电子包装技术会议(EPTC '06),PP。271-276。)。它们需要模块之间的电气和机械连接功能。在某些情况下,这些装置将受到双轴和/或循环机械菌株的影响,特别是对于可穿戴应用。复制这些机械菌株并了解它们对器件功能的影响对于满足性能,工艺和可靠性要求至关重要。在本文中,提出了类似于在人体上的可穿戴装置中发生类似的双轴和外平面菌株的方法。根据预期的故障模式,可以使用电气和/或光学监测(其他方法)来确定对故障的循环。故障模式可包括可拉伸区域的痕迹损坏,功能部件区域的痕迹损坏,或散装可拉伸材料损坏等。描述了三种不同的施加机械菌株的方法,包括可拉伸的气囊方法,膜试验方法和横向膨胀方法。

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  • 来源
    《Journal of Electronic Packaging》 |2017年第2期|020905.1-020905.7|共7页
  • 作者单位

    Intel Corporation 5000 W Chandler Boulevard Chandler AZ 85226;

    Intel Corporation 5000 W Chandler Boulevard Chandler AZ 85226;

    Intel Corporation 5000 W Chandler Boulevard Chandler AZ 85226;

    Intel Corporation 5000 W Chandler Boulevard Chandler AZ 85226;

    Intel Corporation 5000 W Chandler Boulevard Chandler AZ 85226;

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  • 正文语种 eng
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