首页> 外文期刊>Journal of Electronic Materials >Nucleation Control and Thermal Aging Resistance of Near-Eutectic Sn-Ag-Cu-X Solder Joints by Alloy Design
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Nucleation Control and Thermal Aging Resistance of Near-Eutectic Sn-Ag-Cu-X Solder Joints by Alloy Design

机译:合金设计近共晶Sn-Ag-Cu-X焊点的成核控制和抗热老化性能

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摘要

Elemental (X) additions to Sn-3.5Ag-0.95Cu (SAC3595) solder were developed with minimal (<0.25 wt.%) concentration to avoid pro-eutectic Ag3Sn blades by reducing undercooling (ΔT) and to eliminate thermal-aging-induced embrittlement. Calorimetry and microstructure results on simple Cu/Cu joints identified 0.21Zn, 0.10Mn, and 0.05Al as sufficient to reduce undercooling below that for SAC3595 and to eliminate Ag3Sn blades. A 211°C melting onset for the X = Mn alloys also suggested the discovery of a new quaternary eutectic. Shear testing and microstructure analysis of larger joints showed that 0.05Al and 0.21Zn additions resulted in reduced as-soldered strength (30 MPa), like Sn-0.95Cu, but all joints showed ductile failure at about 30 MPa after 1000 h at 150°C.
机译:开发出具有最小(<0.25 wt。%)浓度的Sn-3.5Ag-0.95Cu(SAC3595)焊料中的元素(X)添加剂,可通过减少过冷度(ΔT)来避免共晶Ag 3 Sn叶片)并消除热老化引起的脆化。简单的Cu / Cu接头的量热法和微观结构结果表明,0.21Zn,0.10Mn和0.05Al足以将过冷度降低到SAC3595之下,并消除了Ag 3 Sn叶片。 X = Mn合金的211°C熔化开始也表明发现了一种新的四元共晶。较大接头的剪切测试和显微结构分析表明,添加0.05Al和0.21Zn会导致焊后强度(30 MPa)降低,类似于Sn-0.95Cu,但所有接头在150°下1000 h后在30 MPa时均显示出延性破坏C。

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